A multi-reflection time-of-flight mass spectrometer for mass measurements of short-lived nuclei

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 241, Issue 1-4, 2005, Pages 983-985

  Ishida, Y ^a   Wada, M ^a   Wollnik, H ^b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

Precise mass measurement; RF ion guide; Time of flight mass spectrometer

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; ELECTROSTATICS; ION BEAMS; MASS SPECTROMETRY; MIRRORS;

PRECISE MASS MEASUREMENT; RF ION-GUIDE; TIME-OF-FLIGHT MASS SPECTROMETER;

RADIOISOTOPES;

EID: 28044433864     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.07.158     Document Type: Conference Paper

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