Direct preparation of particles from liquid suspension for ESEM or SEM analysis

Journal of Microscopy

Volumn 220, Issue 1, 2005, Pages 65-69

  Wight, Scott A ^a   Holbrook, R D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Carbon; ESEM SEM; Filter; Particle; Planchet; Sample preparation

Indexed keywords

BANDPASS FILTERS; FILTRATION; GRAPHITE; SUSPENSIONS (FLUIDS);

DIRECT PREPARATION; ESEM/SEM; FILTER; LIQUID SUSPENSION; PARTICLE; PLANCHET; RAPID ANALYSIS; SAMPLE PREPARATION; SEM ANALYSIS; SIMPLIFIED METHOD;

SCANNING ELECTRON MICROSCOPY;

CARBON; GRAPHITE;

ANALYTIC METHOD; ARTICLE; ELECTRON MICROSCOPY; ENVIRONMENTAL MONITORING; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; FILTRATION; FLY ASH; HYDRAULIC CONDUCTIVITY; LIQUID SUSPENSION; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SUSPENDED PARTICULATE MATTER; SUSPENSION; WATER SUPPLY;

EID: 27944509599     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01515.x     Document Type: Article

References (1)

1. Windsor, E.S., Newbury, D.E., Kessler, J.D. & Chi, P.H. (1999) Boron substrates for particulate X-ray microanalysis. Microsc. Microanal. 5 (Suppl. 2: Proceedings), 920-921