Nanostructural voids in glassy-like As2Se3 studied with FSDP-related XRD and PALS techniques

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 5, 2005, Pages 2267-2273

  Kavetskyy, T S ^a,b   Shpotyuk, O I ^b,c  

^a DROHOBYCH IVAN FRANKO STATE PEDAGOGICAL UNIVERSITY   (Ukraine)

^b SCIENTIFIC RESEARCH COMPANY CARAT   (Ukraine)

^c JAN DLUGOSZ UNIVERSITY   (Poland)

Author keywords

Chalcogenide glasses; First sharp diffraction peak; Positron annihilation; X ray diffraction

Indexed keywords

CHALCOGENIDES; GLASS; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; SELENIUM COMPOUNDS;

CHALCOGENIDE GLASS; EMPIRICAL RELATIONSHIPS; FIRST SHARP DIFFRACTION PEAK; IN NETWORKS; NANO-VOIDS; NANOSTRUCTURAL; POSITRON ANNIHILATION LIFETIME SPECTROSCOPY; STRUCTURAL NETWORKS;

X RAY DIFFRACTION;

EID: 27944502132     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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