BEOL variability and impact on RC extraction

Proceedings - Design Automation Conference

Volumn , Issue , 2005, Pages 758-759

  Nagaraj, N S ^a   Bonifield, Tom ^a   Singh, Abha ^a   Bittlestone, Clive ^a   Narasimha, Usha ^a   Le, Viet ^a   Hill, Anthony ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

Extraction; Interconnect; Process variation

Indexed keywords

ERROR ANALYSIS; PERFORMANCE; PROCESS ENGINEERING; SIGNAL PROCESSING;

CIRCUIT PERFORMANCE; INTERCONNECT; PROCESS VARIATION;

CAPACITANCE;

EID: 27944489649     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dac.2005.193913     Document Type: Conference Paper

References (1)

1. Nagaraj NS et. al., "Benchmarks for Interconnect Parasitic Resistance and Capacitance" in proc. of ISQED 2003.