An efficient methodology for noise characterization

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 2005, Pages 330-335

  Varshney, Gaurav Kumar ^a   Chandrasekar, Sreeram ^a  

^a TEXAS INSTRUMENTS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE COUPLING; NOISE CHARACTERIZATION; SIGNAL NOISE;

INTERPOLATION; PARAMETER ESTIMATION; SIGNAL TO NOISE RATIO;

ACOUSTIC NOISE MEASUREMENT;

EID: 27944461812     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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2. Noise Analysis and Correlation, Synopsys EDA Interoperability Developer's Forum, October 2002, SEQUENCE
3. Signal Integrity Sign-Off- Whitepaper, 2003 Synopsys Inc.
4. Ken Tseng, Vinod K. et. al. Static Noise Analysis with Noise Windows, June 2-6 DAC 2003.
5. Bill Mullen (Director SI Analysis R&D Group, Synopsys) - Modeling for Static Noise Analysis, Oct 15, 2002, Synopsys, Inc.
6. B.P. Flannery, S. A. Teukolsky, W. T. Vetterling. Numerical Recipes: The Art of Scientific Computing (ISBN-0-521-43108-5)
7. Eric W. Weisstein. "Nonlinear Least Squares Fitting"from MathWorld - A Wolfram Web Resource.