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Volumn , Issue , 2005, Pages 267-270
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X-ray absorption fine structure study of aging behavior of oxidized copper in CdTe films
a a b,c |
Author keywords
[No Author keywords available]
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Indexed keywords
ADVANCED PHOTON SOURCE;
DOPING DENSITIES;
POLYCRYSTALLINE FILMS;
X-RAY ABSORPTION;
AGING OF MATERIALS;
FUSED SILICA;
GRAIN BOUNDARIES;
HEAT TREATMENT;
MAGNETRON SPUTTERING;
MOLECULAR STRUCTURE;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTOR DOPING;
THIN FILMS;
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EID: 27944461525
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (15)
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