Performance test of amorphous silicon modules in different climates - Year three: Higher minimum operating temperatures lead to higher performance levels

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1635-1638

  Ruther R ^a,b   Tamizh Mani, G ^c   Del Cueto, J ^d   Adelstein, J ^d   Dacoregio, M M ^b   Von Roedern, B ^d  

^a Departamento de Engenharia Civil   (Brazil)

^b FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

^c ARIZONA STATE UNIVERSITY   (United States)

^d NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT-INDUCED DEGRADATION; SOLAR MODULES;

DEGRADATION; SIMULATORS; THIN FILMS;

AMORPHOUS SILICON;

EID: 27944461061     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2005.1488459     Document Type: Conference Paper

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