Geochemistry: Retention of xenon in quartz and earth's missing xenon

Science

Volumn 310, Issue 5751, 2005, Pages 1174-1177

  Sanloup, Chrystèle ^a   Schmidt, Burkhard C ^b,f   Perez, Eva Maria Chamorro ^c   Jambon, Albert ^a   Gregoryanz, Eugene ^d   Mezouar, Mohamed ^e  

^a SORBONNE UNIVERSITÉ   (France)

^b UNIVERSITÄT BAYREUTH   (Germany)

^c UNIVERSITÉ DE LYON   (France)

^d UNIVERSITY OF EDINBURGH   (United Kingdom)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^f UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

QUARTZ; SILICON; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

SYNCHROTRON X-RAY DIFFRACTION; TERRESTRIAL OXIDES;

XENON;

SILICON DIOXIDE; XENON;

GEOCHEMISTRY; QUARTZ; SILICON; XENON;

ARTICLE; ASTRONOMY; ATMOSPHERE; GAS; HIGH TEMPERATURE PROCEDURES; PRESSURE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON; X RAY DIFFRACTION;

EID: 27944453923     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1119070     Document Type: Article

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