Prevalence of Coulomb blockade in electro-migrated junctions with conjugated and non-conjugated molecules

Nanotechnology

Volumn 16, Issue 12, 2005, Pages 3110-3114

  De Picciotto, A ^a   Klare, J E ^a   Nuckolls, C ^a   Baldwin, K ^b   Erbe, A ^b   Willett, R ^b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB BLOCKADE; ELECTRIC CONDUCTANCE; SEMICONDUCTOR JUNCTIONS;

CONJUGATED MOLECULES; ELECTRO-MIGRATION GAP JUNCTIONS;

MOLECULAR STRUCTURE;

EID: 27944452994     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/16/12/064     Document Type: Article

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