Using static analysis to improve automatic test generation

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 1785 LNCS, Issue , 2000, Pages 235-250

  Bozga, Marius ^a   Fernandez, Jean Claude ^b   Ghirvu, Lucian ^a  

^a CNRS   (France)

^b ZIRST   (France)

Author keywords

Asynchronous systems; Bisimulation; Conformance testing; Slicing; Static analysis

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER SCIENCE; COMPUTERS; SOFTWARE TESTING;

ASYNCHRONOUS SYSTEM; AUTOMATIC CONSTRUCTION; AUTOMATIC TEST GENERATION; BISIMULATIONS; CONFORMANCE TESTING; SLICING; STATE EXPLOSION PROBLEMS; TELECOMMUNICATION PROTOCOLS;

STATIC ANALYSIS;

EID: 27944452663     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-46419-0_17     Document Type: Conference Paper

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