Theory of cathode trajectory characterization by canonical mapping transformation

Journal of Electron Microscopy

Volumn 54, Issue 4, 2005, Pages 331-343

  Fujita, Shin ^a,b   Shimoyama, Hiroshi ^b  

^a SHIMADZU CORPORATION   (Japan)

^b MEIJO UNIVERSITY   (Japan)

Author keywords

Aberration; Crossover; Electron gun; Electron trajectory; Focal length; Optical parameter

Indexed keywords

ABERRATIONS; CATHODES; ELECTRONS; MAPPING; TRAJECTORIES;

CANONICAL MAPPINGS; CONDITION; CROSSOVER; ELECTRON TRAJECTORIES; FOCAL LENGTHS; LENGTH FACTORS; MAGNIFICATION FACTORS; MAPPING TRANSFORMATION; OPTICAL PARAMETER; PARAXIAL;

ELECTRON GUNS;

EID: 27944445019     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi052     Document Type: Article

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