Experiments on eigenfaces robustness

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 1, 2002, Pages 421-423

  Lemieux, Alexandre ^a   Parizeau, Marc ^a  

^a UNIVERSITÉ LAVAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; IMAGE ANALYSIS; IMAGE QUALITY; IMAGE SEGMENTATION; IMAGE PROCESSING; PATTERN RECOGNITION;

DESKEWING; EIGENFACES; EIGENFACES ROBUSTNESS; ZOOMING;

FACE RECOGNITION;

COLOR IMAGES; DOWNSAMPLING; EIGENFACES METHOD; FACE RECOGNITION SYSTEMS; IMAGE PREPROCESSING; PRE-PROCESSING STEP; REAL IMAGES; SURVEILLANCE SYSTEMS;

EID: 27944444669     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

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