Performance and reliability of a 1-kW amorphous silicon photovoltaic roofing system

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 1627-1630

  Adelstein, J ^a   Sekulic, B ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNUAL DEGRADATION; SEASONAL FLUCTUATIONS;

AMORPHOUS SILICON; CRYSTALLINE MATERIALS; DATA REDUCTION; DEGRADATION; RELIABILITY;

PHOTOVOLTAIC EFFECTS;

EID: 27944434308     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2005.1488457     Document Type: Conference Paper

References (5)

1. th IEEE PVSC, 2000, p.1446-1449.
2. th IEEE PVSC, 1997, p.1253-1256.
3. st IEEE PVSC, 2005 (in press).
4. D.L. Staebler and C.R. Wronski, "Reversible Conductivity Changes in Discharge-Produced Amorphous Si" Appl. Phys. Lett. 31, 292-294 (1977).
5. IEC, "Photovoltaic system performance monitoring guidelines for measurement, data exchange and analysis, IEC Standard 61734", Geneva, Switzerland, 1998.