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Volumn 20, Issue 1, 2005, Pages 32-42
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A new approach to near- and mid-infrared process analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 27844604647
PISSN: 08876703
EISSN: None
Source Type: Journal
DOI: None Document Type: Review |
Times cited : (8)
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References (0)
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