Role of IrO2 Electrode in Reducing the Retention Loss of Ir/IrO2/Pb(Zr,Ti)O3/Ir Capacitors

Integrated Ferroelectrics

Volumn 67, Issue , 2004, Pages 143-149

  Jo, J Y ^a   Yoon, J G ^b   Lee, J K ^c   Koo, J M ^c   Won, J Y ^c   Kim, S P ^c   Noh, T W ^a  

^a Seoul National University   (South Korea)

^b Suwon University   (South Korea)

^c Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; FERROELECTRIC DEVICES; HYSTERESIS; IRIDIUM COMPOUNDS; PROBLEM SOLVING; RELIABILITY THEORY;

FERROELECTRIC CAPACITORS; HYSTERESIS MEASUREMENTS; INTERFACE DEFECT CHARGES;

ELECTRODES;

EID: 27844600622     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580490898678     Document Type: Article

References (7)

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5. B. Nagaraj, Influence of contact electrodes on leakage characteristics in ferroelectric thin films. J. Appl. Phys. 90, 375-382 (2001).
6. D. M. Smyth, Ferroelectrics 116, 117 (1991).
7. R. Warren, Driving force behind voltage shifts in ferroelectric materials. Appl. Phys. Lett. 68, 1681-1683 (1996).