The inertial properties of quality control charts

Technometrics

Volumn 47, Issue 4, 2005, Pages 425-436

  Woodall, William H ^a   Mahmoud, Mahmoud A ^b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b Cairo University   (Egypt)

Author keywords

Cumulative sum chart; Exponentially weighted moving average chart; Multivariate chart; Shewhart chart; Statistical process control

Indexed keywords

CUMULATIVE SUM CHARTS; EXPONENTIALLY WEIGHTED MOVING AVERAGE CHART; SHEWHART CHART; SIGNAL RESISTANCE;

MULTIVARIABLE SYSTEMS; SIGNAL PROCESSING; STATISTICAL PROCESS CONTROL;

QUALITY CONTROL;

EID: 27844579581     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000256     Document Type: Article

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