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Volumn 15, Issue 9, 2005, Pages 561-563

High temperature dielectric stability of liquid crystal polymer at mm-wave frequencies

Author keywords

Coefficient; Dielectric; Liquid crystal polymer (LCP); Mm wave; Resonance; Resonator; Temperature

Indexed keywords

HIGH TEMPERATURE DIELECTRIC STABILITY; OPERATING TEMPERATURES; TEMPERATURE COEFFICIENTS;

EID: 27844578161     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2005.855369     Document Type: Conference Paper
Times cited : (26)

References (5)
  • 1
    • 2442564535 scopus 로고    scopus 로고
    • Characterization of liquid crystal polymer (LCP) material and transmission lines on LCP substrates from 30-110 GHz
    • Apr.
    • D. C. Thompson, O. Tantot, H. Jallageas, G. E. Ponchak, M. M. Tentzeris, and J. Papapolymerou, "Characterization of liquid crystal polymer (LCP) material and transmission lines on LCP substrates from 30-110 GHz," IEEE Trans. Microwave Theory Tech., vol. 52, no. 4, pp. 1343-1352, Apr. 2004.
    • (2004) IEEE Trans. Microwave Theory Tech. , vol.52 , Issue.4 , pp. 1343-1352
    • Thompson, D.C.1    Tantot, O.2    Jallageas, H.3    Ponchak, G.E.4    Tentzeris, M.M.5    Papapolymerou, J.6
  • 2
    • 27844456626 scopus 로고    scopus 로고
    • private communication, Sept.
    • S. Kennedy, private communication, Sept. 2004.
    • (2004)
    • Kennedy, S.1
  • 3
    • 84861278871 scopus 로고    scopus 로고
    • Rogers Corporation, Materials data sheets, Rogers Corporation website, 2005.
    • (2005) Materials Data Sheets
  • 4
    • 0010544751 scopus 로고    scopus 로고
    • Dielectric and conductor-loss characterization and measurements on electronic packaging materials
    • Nat. Inst. Standards Technol., Boulder, CO, Jul.
    • J. Baker-Jarvis et al., "Dielectric and conductor-loss characterization and measurements on electronic packaging materials," NIST Technical Note 1520, Nat. Inst. Standards Technol., Boulder, CO, Jul. 2001.
    • (2001) NIST Technical Note , vol.1520
    • Baker-Jarvis, J.1
  • 5
    • 0026188064 scopus 로고
    • A multiline method of network analyzer calibration
    • Dec.
    • R. B. Marks, "A multiline method of network analyzer calibration," IEEE Trans. Microwave Theory Tech., vol. 39, no. 12, pp. 1205-1215, Dec. 1991.
    • (1991) IEEE Trans. Microwave Theory Tech. , vol.39 , Issue.12 , pp. 1205-1215
    • Marks, R.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.