I-V reverse characteristic instability of high voltage silicon PN junctions at high temperature

Proceedings of the International Semiconductor Conference, CAS

Volumn 2, Issue , 2004, Pages 315-318

  Obreja, Vasile V N ^a   Codreanu, Cecilia ^a   Podaru, Cecilia ^a  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; HIGH TEMPERATURE EFFECTS; SEMICONDUCTOR DIODES; STABILITY; VOLTAGE CONTROL;

JUNCTION STABILITY; REVERSE CURRENTS; REVERSE VOLTAGE; SILICON DIODES;

SEMICONDUCTOR JUNCTIONS;

EID: 27844550207     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. V.V.N.Obreja, K.I.Nuttall, O.Buiu,"Electrical characteristics of present-day manufactured power semiconductor PN junctions and the I-V characteristic theory", Proc. 26th International Semiconductor Conference(CAS), 2003, Sinaia, Romania, pp.253-256.
2. K.I.Nuttall, O. Buiu, V.V.N.Obreja, "Surface leakage current related failure of power silicon devices operated at high junction temperature", 14th European Symposium on Raliability of Electron Devices, Failure Physics and Analysis, Bordeaux, France, 2003, Microelectronics and Reliability vol. 43, pp. 1913-1918, Sept-Nov. 2003.
3. V.V.N.Obreja, C. Codreanu, K.I. Nuttall, O. Buiu, "Experiments on Behaviour of Power Silicon PN Junctions under Reverse Bias Voltage at High Temperature", in Proc. EuroSIME Conference, May 2004, Brussels.Belgium pp.185-190.
4. V.V.N. Obreja, O. Buiu, K.I. Nuttall, C.Codreanu, M.L. Sung, P.Pei, "Catastrophic Failure of Power Silicon PN Junctions at High Temperature Induced by the Surface Leakage Reverse Current" (accepted paper) 11th IEEE Intern. Symp. on Physical and Failure Analysis of Integrated Circuits, (IPFA2004, July 2004, Hsinchu, Taiwan.
5. V.V.N. Obreja, C.Codreanu, K.I. Nuttall, O. Buiu, C. Podaru, "The Operation Temperature of Silicon Power Thyristors and the Blocking Leakage Current" (accepted paper) 35th IEEE Power Electronics Specialists Conference(PESC2004), June 2004, Aachen, Germany.