Double-pass axially resolved confocal Mueller matrix imaging polarimetry

Optics Letters

Volumn 30, Issue 21, 2005, Pages 2879-2881

  Lara, David ^a   Dainty, Chris ^a  

^a NATIONAL UNIVERSITY OF IRELAND   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE-PASS AXIALLY RESOLVED CONFOCAL MUELLER MATRIX IMAGING POLARIMETRY; GLASS PLATES; LINEAR RETARDERS; POLARIZATION-SENSITIVE MEASUREMENTS;

COMPUTER SIMULATION; GLASS; LIGHT POLARIZATION; MATRIX ALGEBRA; POLARIMETERS; SENSITIVITY ANALYSIS;

IMAGE PROCESSING;

ARTICLE; CONFOCAL MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; OPTICAL COHERENCE TOMOGRAPHY; POLARIZATION MICROSCOPY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, CONFOCAL; MICROSCOPY, POLARIZATION; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 27844532091     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.30.002879     Document Type: Article

References (7)

1. J. F. de Boer and T. E. Milner, J. Biomed. Opt. 7, 359 (2002).
2. M. Pircher, E. Goetzinger, R. Leitgeb, and C. K. Hitzenberger, Phys. Med. Biol. 49, 1257 (2004).
3. S. Jiao, G. Yao, and L. V. Wang, Appl. Opt. 39, 6318 (2000).
4. R. A. Chipman, in Handbook of Optics, M. Bass, ed. (McGraw-Hill, 1995), Vol. 2, Chap. 22, pp. 22.1-22.37.
5. D. Lara and C. Dainty, "Axially resolved complete polarization sensitive imaging with a confocal Mueller matrix imaging polarimeter," Appl. Opt.
6. E. Compain, S. Poirier, and B. Drevillon, Appl. Opt. 38, 3490 (1999).
7. S.-Y. Lu and R. A. Chipman, J. Opt. Soc. Am. A 13, 1106 (1996).