VUV-ellipsometry on GaN: Probing conduction band properties by core level excitations

Physica Status Solidi (B) Basic Research

Volumn 242, Issue 13, 2005, Pages 2601-2609

  Esser, N ^a   Rakel, M ^a   Cobet, C ^a   Schmidt, W G ^b   Braun, W ^c   Cardona, M ^d  

^a ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 27844523243     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200541315     Document Type: Conference Paper

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