Fragmentary model as applied to analysis of spectroscopically pure vitreous SiO2

Glass Physics and Chemistry

Volumn 31, Issue 5, 2005, Pages 648-655

  Aleinikova, K B ^a   Likhach, N I ^a  

^a VORONEZH STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; CRYSTALLINE MATERIALS; DIFFUSION; INTEGRATED CIRCUITS; QUARTZ; SILICON WAFERS; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ATOMIC RADIAL DISTRIBUTION FUNCTIONS (ARDF); FRAGMENTARY MODEL; INTEGRATED MICROCIRCUITS; QUARTZ CRYSTALS;

FUSED SILICA;

EID: 27844521016     PISSN: 10876596     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10720-005-0109-6     Document Type: Article

References (17)

1. Wright, A.C., Neutron Scattering from Vitreous Silica. The Structure of Vitreous Silica: What Have We Learned from 60 Years of Diffraction Studies, J. Non-Cryst. Solids, 1994, vol. 179, pp. 84-115.
2. Wright, A.C., Diffraction Studies of Glass Structure: The First 70 Years, Fiz. Khim. Stekla, 1998, vol. 24, no. 3, pp. 218-265
3. [Glass Phys. Chem. (Engl. trasl.) vol. 24, no. 3, pp. 148-179].
4. Wright, A.C., Diffraction Studies of Glass Structure, J. Non-Cryst. Solids, 1990, vol. 123, pp. 129-148.
5. Yong, D. and Tokuro, N., Wavelength Structural Analysis of Silica Glasses Manufactured by Different Methods, J. Non-Cryst. Solids, 1997, vol. 222, pp. 50-58.
6. Carol, S.M. and Jeremy, K.B., Geometric Constraints: A Refined Model for the Structure of Silica Glasses, J. Non-Cryst. Solids, 1990, vol. 124, pp. 1-21.
7. Porai-Koshits, E.A., On the Short- and Medium-Range Orders in Glass Structure, Fiz. Khim. Stekla, 1992, vol. 18, no. 5, pp. 43-50
8. [Sov. J. Glass Phys. Chem. (Engl. transl.), 1992, vol. 18, no. 5, pp. 361-364].
9. Aleinikova, K.B., Lesovoi, M.V., and Perin, Yu.N., A Fragmentary Model of Atomic Structure of Multicomponent Amorphous Materials with Dominant Covalent Bonding, Izv. Akad. Nauk, Ser. Fiz., 1993, vol. 57, no. 2, pp. 85-90.
10. Kazimirov, V.P., Smyk, S.Yu., and Skol'skii, V.E., Termination Effect in X-ray Diffraction Studies of Disordered Systems, Kristallografiya, 2000, vol. 45, no. 1, pp. 12-15.
11. Nabitovich, I.D., Stetsiv, Ya.I., and Voloshchuk, Ya.V., Determination of Coherent and Background Intensities from Experimental Curve of Electron Scattering, Kristallografiya, 1967, vol. 12, no. 4, pp. 584-590.
12. Sokol'skii, V.E., Kazimirov, V.P., and Shovskii, V.A., Normalization of Intensity Curves in X-ray Diffraction by Disordered Systems, Kristallografiya, 2000, vol. 45, no. 3, pp. 398-401.
13. Gillavry, C.M., Rieck, G.D., and Press, K., International Tables for X-ray Crystallography, Birmingham, 1962.
14. Vainshtein, B.K., On the Radial Distribution Theory, Kristallografiya, 1957, vol. 2, no. 1, pp. 29-37.
15. Porai-Koshits, M.A., Prakticheskii kurs rentgenostrukturnogo analiza (Practical Course of X-ray Diffraction Analysis), Moscow: Mosk. Gos. Univ., 1960.
16. 2, Fiz. Khim. Stekla, 1992, vol. 18, no. 1, pp. 57-69
17. [Sov. J. Glass Phys. Chem. (Engl. transl.), 1992, vol. 18, no. 1, pp. 28-34].