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Volumn 14, Issue 4, 2004, Pages 155-157
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The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 27844520829
PISSN: 09599436
EISSN: 1364551X
Source Type: Journal
DOI: 10.1070/MC2004v014n04ABEH001963 Document Type: Article |
Times cited : (4)
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References (10)
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