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Volumn 14, Issue 4, 2004, Pages 155-157

The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy

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EID: 27844520829     PISSN: 09599436     EISSN: 1364551X     Source Type: Journal    
DOI: 10.1070/MC2004v014n04ABEH001963     Document Type: Article
Times cited : (4)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.