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Volumn 47, Issue 4, 2005, Pages 446-456

A bayesian scheme to detect changes in the mean of a short-run process

Author keywords

Bayesian statistical process control; Kalman filter; Normal mixture; Tool wear

Indexed keywords

BAYESIAN STATISTICAL PROCESS CONTROL; NORMAL MIXTURE; TOOL WEAR;

EID: 27844464414     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017005000000346     Document Type: Article
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.