SCOPUS 정보 검색 플랫폼

Volumn 494, Issue 1-2, 2006, Pages 69-73

Carrier concentration dependent optical properties of wurzite InN epitaxial films on Si(111) studied by spectroscopic ellipsometry

(4) Ahn, H a Shen, C H b Wu, C L b Gwo, S b

a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Taiwan)

b NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

Buffer layer; Energy bandgap; InN; Refractive index; Spectroscopic ellipsometry (SE)

Indexed keywords

CARRIER CONCENTRATION; ELLIPSOMETRY; ENERGY GAP; EPITAXIAL GROWTH; INDIUM COMPOUNDS; LIGHT ABSORPTION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS; ENERGY BANDGAP; EPITAXIAL FILMS; SPECTROSCOPIC ELLIPSOMETRY (SE);

THIN FILMS;

EID: 27844462512 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.07.177 Document Type: Conference Paper

Times cited : (8)

References (16)

1
- 0141608080
- A.G. Bhuiyan, A. Hashimoto, and A. Yamamoto J. Appl. Phys. 94 2003 2779 (and references therein)
- (2003) J. Appl. Phys. , vol.94 , pp. 2779
- Bhuiyan, A.G.¹ Hashimoto, A.² Yamamoto, A.³

2
- 4244203187
- V.Yu. Davydov, A.A. Klochikhin, R.P. Seisyan, V.V. Emtsev, S.V. Ivanov, F. Bechstedt, J. Furthmüller, H. Harima, A.V. Mudryi, J. Aderhold, O. Semchinova, and J. Graul Phys. Status Solidi, B Basic Res. 229 2002 R1
- (2002) Phys. Status Solidi, B Basic Res. , vol.229
- Davydov, V.Yu.¹ Klochikhin, A.A.² Seisyan, R.P.³ Emtsev, V.V.⁴ Ivanov, S.V.⁵ Bechstedt, F.⁶ Furthmüller, J.⁷ Harima, H.⁸ Mudryi, A.V.⁹ Aderhold, J.¹⁰ Semchinova, O.¹¹ Graul, J.¹²

3
- 79956030105
- J. Wu, W. Walukiewicz, K.M. Yu, J.W. Ager III, E.E. Haller, H. Lu, W.J. Schaff, Y. Saito, and Y. Nanishi Appl. Phys. Lett. 80 2002 3967
- (2002) Appl. Phys. Lett. , vol.80 , pp. 3967
- Wu, J.¹ Walukiewicz, W.² Yu, K.M.³ Ager III, J.W.⁴ Haller, E.E.⁵ Lu, H.⁶ Schaff, W.J.⁷ Saito, Y.⁸ Nanishi, Y.⁹

4
- 79955992797
- T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, and E. Kurimoto Appl. Phys. Lett. 81 2002 1246
- (2002) Appl. Phys. Lett. , vol.81 , pp. 1246
- Matsuoka, T.¹ Okamoto, H.² Nakao, M.³ Harima, H.⁴ Kurimoto, E.⁵

5
- 0042767997
- K. Xu, and A. Yoshikawa Appl. Phys. Lett. 83 2003 251
- (2003) Appl. Phys. Lett. , vol.83 , pp. 251
- Xu, K.¹ Yoshikawa, A.²

6
- 2942601794
- S. Gwo, C.-L. Wu, C.-H. Shen, W.-H. Chang, T.M. Hsu, J.-S. Wang, and J.-T. Hsu Appl. Phys. Lett. 84 2004 3765
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3765
- Gwo, S.¹ Wu, C.-L.² Shen, C.-H.³ Chang, W.-H.⁴ Hsu, T.M.⁵ Wang, J.-S.⁶ Hsu, J.-T.⁷

7
- 0000038685
- T.L. Tansley, and C.P. Foley J. Appl. Phys. 59 1986 3241
- (1986) J. Appl. Phys. , vol.59 , pp. 3241
- Tansley, T.L.¹ Foley, C.P.²

8
- 0026912067
- Q. Guo, O. Kato, M. Fujisawa, and A. Yoshida Solid State Commun. 83 1992 721
- (1992) Solid State Commun. , vol.83 , pp. 721
- Guo, Q.¹ Kato, O.² Fujisawa, M.³ Yoshida, A.⁴

9
- 20244380423
- T.V. Shubina, S.V. Ivanov, V.N. Jmerik, D.D. Solnyshkov, V.A. Vekshin, P.S. Kop'ev, A. Vasson, J. Leymarie, A. Kavokin, H. Amano, K. Shimono, A. Kasic, and B. Monemar Phys. Rev. Lett. 92 2004 117407-1
- (2004) Phys. Rev. Lett. , vol.92 , pp. 117407-117411
- Shubina, T.V.¹ Ivanov, S.V.² Jmerik, V.N.³ Solnyshkov, D.D.⁴ Vekshin, V.A.⁵ Kop'Ev, P.S.⁶ Vasson, A.⁷ Leymarie, J.⁸ Kavokin, A.⁹ Amano, H.¹⁰ Shimono, K.¹¹ Kasic, A.¹² Monemar, B.¹³

10
- 0742285875
- L.F. Jiang, W.Z. Shen, H.F. Yang, H. Ogawa, and Q.X. Guo Appl. Phys., A 78 2004 89
- (2004) Appl. Phys., A , vol.78 , pp. 89
- Jiang, L.F.¹ Shen, W.Z.² Yang, H.F.³ Ogawa, H.⁴ Guo, Q.X.⁵

11
- 3242803235
- A.B. Djurisic, and E.H. Li J. Appl. Phys. 85 1999 2848
- (1999) J. Appl. Phys. , vol.85 , pp. 2848
- Djurisic, A.B.¹ Li, E.H.²

12
- 0037087950
- A. Kasic, M. Schubert, Y. Saito, and Y. Nanishi Phys. Rev., B 65 2002 115206-1
- (2002) Phys. Rev., B , vol.65 , pp. 115206-115211
- Kasic, A.¹ Schubert, M.² Saito, Y.³ Nanishi, Y.⁴

13
- 20844437709
- GaN and Related Alloys-2002
- E.T. Yu C.M. Wetzet J.S. Speck A. Rizzi Y. Arakawa Materials Research Society Pittsburgh
- R. Goldhahn, S. Shokhovets, V. Cimallam, L. Spiess, G. Ecke, O. Ambacher, J. Furthmüller, F. Bechstedt, H. Lu, and W.J. Schaff E.T. Yu C.M. Wetzet J.S. Speck A. Rizzi Y. Arakawa GaN and Related Alloys-2002 Mater. Res. Soc. Symp. Proc. vol. 743 2003 Materials Research Society Pittsburgh L5.9.1
- (2003) Mater. Res. Soc. Symp. Proc. , vol.743
- Goldhahn, R.¹ Shokhovets, S.² Cimallam, V.³ Spiess, L.⁴ Ecke, G.⁵ Ambacher, O.⁶ Furthmüller, J.⁷ Bechstedt, F.⁸ Lu, H.⁹ Schaff, W.J.¹⁰

14
- 0000969646
- T. Kawashima, H. Yoshikawa, A. Adachi, S. Fluke, and K. Ohtsuka J. Appl. Phys. 82 1997 3528
- (1997) J. Appl. Phys. , vol.82 , pp. 3528
- Kawashima, T.¹ Yoshikawa, H.² Adachi, A.³ Fluke, S.⁴ Ohtsuka, K.⁵

15
- 0346846599
- C.-L. Wu, J.-C. Wang, M.-H. Chan, T.T. Chen, and S. Gwo Appl. Phys. Lett. 83 2003 4530
- (2003) Appl. Phys. Lett. , vol.83 , pp. 4530
- Wu, C.-L.¹ Wang, J.-C.² Chan, M.-H.³ Chen, T.T.⁴ Gwo, S.⁵

16
- 0004040706
- Academic Press Boston
- E.D. Palik Handbook of Optical Constants of Solids 1991 Academic Press Boston
- (1991) Handbook of Optical Constants of Solids
- Palik, E.D.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.