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Volumn 16, Issue 12, 2005, Pages 2489-2497

A micro-CMM with metrology frame for low uncertainty measurements

Author keywords

Dimensional measurements; Equation of motion; Fibre probe; Metrology frame, micro metrology; Micro CMM; Thermal drift; Uncertainty budget

Indexed keywords

EQUATIONS OF MOTION; INTERFEROMETERS; MEASUREMENTS; MICROSTRUCTURE; MIRRORS; OPTICAL FIBERS;

EID: 27844438958     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/16/12/013     Document Type: Article
Times cited : (34)

References (9)
  • 5
    • 0006141982 scopus 로고    scopus 로고
    • Development of a special CMM for dimensional metrology on microsystem components
    • Brand U, Kleine-Besten T and Schwenke H 2000 Development of a special CMM for dimensional metrology on microsystem components Proc. ASPE Conf. (Scottsdale, AZ) 542-6
    • (2000) Proc. ASPE Conf. , pp. 542-546
    • Brand, U.1    Kleine-Besten, T.2    Schwenke, H.3
  • 8
    • 0004689101 scopus 로고    scopus 로고
    • Opto-tactile sensor for measuring small structures on coordinate measuring machines
    • Ji G, Schwenke H and Trapet E 1998 Opto-tactile sensor for measuring small structures on coordinate measuring machines Proc. ASPE Ann. Meeting pp 25-8
    • (1998) Proc. ASPE Ann. Meeting , pp. 25-28
    • Ji, G.1    Schwenke, H.2    Trapet, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.