Power quality assessment based on FFT and wavelet transform

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 26, Issue SUPPL., 2005, Pages 115-116

  Sun, Jinfu ^a   Li, Lanfang ^a   Liu, Kaipei ^a  

^a WUHAN UNIVERSITY   (China)

Author keywords

FFT; Power quality; Singularity detect; Wavelet

Indexed keywords

EID: 27744593936     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)