A study of optical properties of gas phase field ionization sources

Advances in Imaging and Electron Physics

Volumn 138, Issue , 2005, Pages 147-175

  Liu, Xuefeng ^a   Orloff, Jon ^a  

^a The Institute for Research in Electronics and Applied Physics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ION MICROSCOPES; IONIZATION; OPTICAL PROPERTIES; OPTICAL SYSTEMS;

CHROMATIC ABERRATION COEFFICIENTS; GAS FIELD IONIZATION SOURCES (GFIS);

ION SOURCES;

EID: 27744585877     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(05)38003-7     Document Type: Review

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