How do correlation and variance of base-experts affect fusion in biometric authentication tasks?

IEEE Transactions on Signal Processing

Volumn 53, Issue 11, 2005, Pages 4384-4396

  Poh, Norman ^a   Bengio, Samy ^a  

^a IDIAP RESEARCH INSTITUTE   (Switzerland)

Author keywords

Ambiguity decomposition; Bias variance covariance decomposition; Biometric authentication; Classification; Pattern recognition; Variance reduction

Indexed keywords

CORRELATION METHODS; ERROR ANALYSIS; MATHEMATICAL MODELS; PATTERN RECOGNITION; REGRESSION ANALYSIS;

AMBIGUITY DECOMPOSITION; BIAS VARIANCE COVARIANCE DECOMPOSITION; BIOMETRIC AUTHENTICATION;

SENSOR DATA FUSION;

EID: 27744533915     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2005.857006     Document Type: Article

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