Emulating media defect corrosion

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 3055-3057

  Dai, Qing ^a   Prada Silva, Guillermo ^a   Yen, Bing K ^a   Marchon, Bruno ^a   Rettner, C T ^b  

^a SAN JOSE RESEARCH CENTER   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

Electrochemistry; Media defect corrosion

Indexed keywords

ALLOYS; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; DEFECTS; ELECTROCHEMISTRY; ION BEAMS; LUBRICANTS; THERMAL EFFECTS;

CORROSION GROWTH; FOCUSED ION BEAM TECHNOLOGY; HUMIDITY STRESSING; MEDIA DEFECT CORROSION;

CORROSION;

EID: 27744521547     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.855258     Document Type: Article

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