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Volumn 11, Issue 9, 2005, Pages 21-23
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Complementary techniques expose GaN transistor defects
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Author keywords
[No Author keywords available]
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Indexed keywords
HEATING;
INFRARED DEVICES;
OHMIC CONTACTS;
RAMAN SPECTROSCOPY;
RELIABILITY;
SEMICONDUCTING GALLIUM COMPOUNDS;
BANDGAP DEVICES;
INFRARED CAMERA;
OHMIC HEATING;
SELF-HEATING EFFECTS;
TRANSISTORS;
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EID: 27744518545
PISSN: 1096598X
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Review |
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Times cited : (2)
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References (0)
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