Microscope Raman scattering and X-ray diffraction study of near-stoichiometric Ti:LiNbO 3 waveguides

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 13, 2005, Pages 2521-2530

  Zhang, De Long ^a,b   Siu, G G ^a   Pun, E Y B ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b TIANJIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL MICROSCOPES; PLANAR WAVEGUIDES; VAPOR TRANSPORT EQUILIBRATION (VTE); WAVEGUIDE LAYERS;

CRYSTALLINE MATERIALS; LIGHT ABSORPTION; LITHIUM COMPOUNDS; RAMAN SCATTERING; STOICHIOMETRY; TRANSPORT PROPERTIES; X RAY POWDER DIFFRACTION;

OPTICAL WAVEGUIDES;

EID: 27744518309     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200520083     Document Type: Article

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