Determination of defect states in semiconductor nanocrystals by cyclic voltammetry

Journal of Physical Chemistry B

Volumn 109, Issue 43, 2005, Pages 20355-20360

  Kuçur, Erol ^a   Bücking, Wendelin ^a   Giernoth, Ralf ^b   Nann, Thomas ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b UNIVERSITY OF COLOGNE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; CRYSTAL DEFECTS; CYCLIC VOLTAMMETRY; SEMICONDUCTOR MATERIALS;

NANOCRYSTALS; NONOPTICAL METHOD;

NANOSTRUCTURED MATERIALS;

EID: 27744512906     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp053891b     Document Type: Article

References (25)

1. Brus, L. E. J. Chem. Phys. 1983, 79, 5566-5571.
2. Norris, D. J.; Efros, A. L.; Rosen, M.; Bawendi, M. G. Phys. Rev. B 1996, 53, 16347-16354.
3. Poles, E.; Selmarten, D. C.; Mićić, O. I.; Nozik, A. J. Appl. Phys. Lett. 1999, 75, 971-973.
4. Sapra, S.; Sarma, D. D. Phys. Rev. B 2004, 69, 125304-1-125304-7.
5. Brillson, L. J. J. Vac. Sci. Technol. 1975, 13, 325-328.
6. Brillson, L. J. Surf. Sci. 1977, 69, 62-84.
7. Hoffmann, H. J.; Huber, E. Physica B & C 1981, 111, 249-256.
8. Türe, I. E.; Russell, G. J.; Woods, J. J. Cryst. Growth 1982, 59, 223-228.
9. Bube, R. H. Phys. Rev. 1955, 99, 1105-1116.
10. Poznyak, S. K.; Osipovich, N. P.; Shavel, A.; Talapin, D. V.; Gao, M.; Eychmüller, A.; Gaponik, N. J. Phys. Chem. B 2005, 109, 1094-1100.
11. Ogawa, S.; Hu, K.; Fan, F.-R. F.; Bard, A. J. J. Phys. Chem. B 1997, 101, 5707-5711.
12. Greene, I. A.; Wu, F.; Zhang, J. Z.; Chen, S. J. Phys. Chem. B 2003, 107, 5733-5739.
13. Giernoth, R.; Krumm, M. Adv. Synth. Catal. 2004, 346, 989-992.
14. Kucur, E.; Riegler, J.; Urban, G. A.; Nann, T. J. Chem. Phys. 2003, 119, 2333-2337.
15. Kucur, E.; Bücking, W.; Arenz, S.; Giernoth, R.; Nann, T. Chem. Phys. Chem. 2005, in press.
16. Haram, S. K.; Quinn, B. M.; Bard, A. J. J. Am. Chem. Soc. 2001, 123, 8860-8861.
17. Bae, Y.; Myung, N.; Bard, A. J. Nano Lett. 2004, 4, 1153-1161.
18. Babentsov, V.; Riegler, J.; Schneider, J.; Ehlert, O.; Nann, T.; Fiederle, M. J. Cryst. Growth 2005, 250, 502-508.
19. Trojanek, F.; Cingolani, R.; Cannoletta, D.; Mikes, D.; Nemec, P.; Uhlirová, E.; Rohovec, J.; Maly, P. J. Cryst. Growth 2000, 209, 695-700.
20. Skarman, J. S. Solid-State Electron. 1965, 8, 17-29.
21. Lee, S.-C.; Lee, M. J. J. Appl. Phys. 2000, 88, 1999-2001.
22. Blachnik, R., Chu, J., Galazka, R. R., Geurts, J., Gutowski, J., Hönerlánge, B., Hoffmann, D., Kossut, J., Levy, R., Michler, P., Neukirch, U., Story, T., Strauch, D., Waag, A., Eds. II-VI and I-VII Compounds, Semimagnetic Compounds; Springer-Verlag: New York, 1999; Vol. 41B.
23. Myung, N.; Ding, Z.; Bard, A. J. Nano Lett. 2002, 2, 1315-1319.
24. Myung, N.; Bae, Y.; Bard, A. J. Nano Lett. 2003, 3, 1053-1055.
25. Poznyak, S. K.; Talapin, D. V.; Shevchenko, E. V.; Weller, H. Nano Lett. 2004, 4, 693-698.