Microstructural and morphological evolutions in compositionally-graded (Ba1-xSrx)TiO3 thin films and related dielectric properties

Integrated Ferroelectrics

Volumn 45, Issue , 2002, Pages 131-140

  Zhu, X H ^a,b   Chan, H L W ^a   Choy, C L ^a   Wong, K H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b NANJING UNIVERSITY   (China)

Author keywords

Compositionally graded films; (ba1 xSrx)TiO 3; Dielectric properties; Structural and morphological evolutions

Indexed keywords

DIELECTRIC PROPERTIES; INTERFACIAL ENERGY; MICROSTRUCTURE; MORPHOLOGY; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

COMPACT SPHERICAL; GRADED FILMS; MORPHOLOGICAL EVOLUTIONS;

THIN FILMS;

EID: 27744496163     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580215343     Document Type: Article

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