Magnetoimpedance in narrow NiFe/Au/NiFe multilayer film systems

IEEE Transactions on Magnetics

Volumn 41, Issue 10, 2005, Pages 3697-3699

  De Cos, D ^a   Panina, L V ^b   Fry, N ^b   Orue, I ^a   Garcia Arribas A ^a   Barandiaran J M ^a  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b UNIVERSITY OF PLYMOUTH   (United Kingdom)

Author keywords

Flux leakage; Head efficiency; Magnetoimpedance sensors; Thin films; Transverse anisotropy

Indexed keywords

ELECTRIC IMPEDANCE; MAGNETIC FLUX; MAGNETIC LEAKAGE; NICKEL COMPOUNDS; SENSITIVITY ANALYSIS; SPUTTERING; THIN FILMS;

FLUX LEAKAGE; HEAD EFFICIENCY; MAGNETOIMPEDANCE SENSORS; TRANSVERSE ANISOTROPY;

MULTILAYERS;

EID: 27744495942     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2005.854812     Document Type: Article

References (8)

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8. D. de Cos, A. García-Arribas, and J. M. Barandiaran, "Analisis of magnetoimpedance measurements at high frequency using a microstrip transmision line," Sens. Actuators A, vol. 115, pp. 368-375, 2004.