Simple plots for monitoring the field reliability of repairable systems

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2005, Pages 539-544

  Trindade, David ^a   Nathan, Swami ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

Computer Systems; Failure Rate; Field Reliability analysis; Mean Cumulative Function; Repairable Systems

Indexed keywords

FAILURE RATE; PROCESSING HARDWARE; TIME DEPENDENT RELIABILITY (TDR); FIELD RELIABILITY ANALYSIS; MEAN CUMULATIVE FUNCTION; REPAIRABLE SYSTEMS;

DECISION MAKING; LARGE SCALE SYSTEMS; SERVERS; STOCHASTIC CONTROL SYSTEMS; COMPUTER OPERATING SYSTEMS; POISSON DISTRIBUTION; RELIABILITY; REPAIR;

COMPUTER OPERATING SYSTEMS; COMPUTER SYSTEMS;

EID: 27744487101     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2005.1408418     Document Type: Conference Paper

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