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Volumn 98, Issue 8, 2005, Pages

Local hysteresis loop measurements by magneto-optical scanning near-field optical microscope

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETO-OPTICAL SCANNING; MICRON-SIZED PATTERNED; NEAR FIELD OPTICAL MICROSCOPY; SQUARE THIN FILMS;

EID: 27744477663     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2115089     Document Type: Article
Times cited : (11)

References (11)
  • 10
    • 85083119910 scopus 로고    scopus 로고
    • M. J. Donahue and D. G. Porter, OOMMF User's Guide, Version 1.0 (NIST, Gaithersburg, MD, 1999); http://math.nist.gov/oommf


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.