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Volumn , Issue , 2005, Pages 416-421

Repairable systems reliability trend tests and evaluation

Author keywords

Homogeneous poisson process; Non homogeneous poisson process; Renewal process; Repairable system; Trend test

Indexed keywords

HOMOGENEOUS POISSON PROCESS; NON-HOMOGENEOUS POISSON PROCESS; RENEWAL PROCESS; REPAIRABLE SYSTEMS; TREND TESTS; REPAIRABLE SYSTEM; TREND TEST;

EID: 27744473432     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (57)

References (15)
  • 1
    • 84888909777 scopus 로고    scopus 로고
    • Military Standard (1981), MIL-HDBK-189, Reliability Growth Management
    • Military Standard (1981), MIL-HDBK-189, Reliability Growth Management.
  • 3
    • 0029734440 scopus 로고    scopus 로고
    • Reliability evaluation: Field experience from Motorola's cellular base transceiver systems
    • Bothwell, R., Donthamsetty, R., Kania, Z. and Wesoloski, R. (1996), Reliability evaluation: field experience from Motorola's cellular base transceiver systems, Proceedings Annual RAMS, pp. 348-359.
    • (1996) Proceedings Annual RAMS , pp. 348-359
    • Bothwell, R.1    Donthamsetty, R.2    Kania, Z.3    Wesoloski, R.4
  • 4
    • 84937650085 scopus 로고
    • Learning curve approach to reliability monitoring
    • Duane, J. T. (1964), Learning curve approach to reliability monitoring, IEEE Trans Aerospace, 2, 563-566.
    • (1964) IEEE Trans Aerospace , vol.2 , pp. 563-566
    • Duane, J.T.1
  • 5
    • 0001782167 scopus 로고
    • Reliability analysis for complex, repairable systems
    • Crow, L. H. (1974) Reliability analysis for complex, repairable systems, SIAM Rel & Biometry, 379-410.
    • (1974) SIAM Rel & Biometry , pp. 379-410
    • Crow, L.H.1
  • 6
    • 84983962195 scopus 로고
    • Forecasting reliability growth
    • John Wiley & Sons
    • Lloyd, D. K. (1986) Forecasting reliability growth, Quality & Rel Engineering, John Wiley & Sons, 2, 19-23.
    • (1986) Quality & Rel Engineering , vol.2 , pp. 19-23
    • Lloyd, D.K.1
  • 9
    • 0029506030 scopus 로고
    • Reliability growth projections with applications to integrated testing
    • Crow, L. H. (1995) Reliability growth projections with applications to integrated testing, Proceedings of the 41st Technical Meeting, IES, pp. 93-103.
    • (1995) Proceedings of the 41st Technical Meeting, IES , pp. 93-103
    • Crow, L.H.1
  • 15
    • 0032273966 scopus 로고    scopus 로고
    • Economic allocation of test times for subsystem-level reliability growth testing
    • Dec
    • Coit, David W. "Economic Allocation of Test Times for Subsystem-Level Reliability Growth Testing," IIE Transactions, vol. 30, no. 12, Dec 1998, pp. 1143-1151.
    • (1998) IIE Transactions , vol.30 , Issue.12 , pp. 1143-1151
    • Coit, D.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.