Learning prototypes and distances: A prototype reduction technique based on nearest neighbor error minimization

Pattern Recognition

Volumn 39, Issue 2, 2006, Pages 180-188

  Paredes, Roberto ^a   Vidal, Enrique ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Condensing; Nearest neighbor; Weighted dissimilarity distances

Indexed keywords

ALGORITHMS; DATA ACQUISITION; ERROR ANALYSIS; IMAGING TECHNIQUES; METRIC SYSTEM; PROBABILITY;

CONDENSING; NEAREST NEIGHBOUR; PROTOTYPE REDUCTION ALGORITHMS; WEIGHTED DISSIMILARITY DISTANCES;

SOFTWARE PROTOTYPING;

EID: 27744468378     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2005.06.001     Document Type: Article

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