A novel detection scheme of trace elements using ICP-MS

Journal of Analytical Atomic Spectrometry

Volumn 20, Issue 11, 2005, Pages 1197-1202

  Yau, Michael H P ^a   Chan, Wing Tat ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; GRAPHIC METHODS; INDUCTIVELY COUPLED PLASMA; IONS; MASS SPECTROMETRY; MODULATION; TRACE ELEMENTS;

ANALYTE IONS; FULL WIDTH AT HALF MAXIMUM (FWHM); INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY (ICP-MS); TIME-RESOLVED ANALYSIS (TRA);

PLASMA APPLICATIONS;

EID: 27744462975     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b508650g     Document Type: Article

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