High-reliability technology of mission-critical IA server PRIMEQUEST

Fujitsu Scientific and Technical Journal

Volumn 41, Issue 3, 2005, Pages 284-290

  Hamada, Ohsai ^a,b,c  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Institute of Electronics   (Japan)

^c IEEE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-RELIABILITY TECHNOLOGY; SYSTEM LEVEL; APPLICATION SPECIFIC INTEGRATED CIRCUIT; MISSION CRITICAL OPERATIONS; PRIMEQUEST; SCALABILITY;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; RELIABILITY; AVAILABILITY;

SERVERS;

EID: 27744461516     PISSN: 00162523     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (0)