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Volumn 12, Issue 5, 2005, Pages 547-548
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Structure determination by single-crystal X-ray diffraction (SXD) at megabar pressures
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 27644580339
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S0909049505024945 Document Type: Editorial |
Times cited : (10)
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References (0)
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