Performance of a dispersion-compensating scanning X-ray spectrometer for compton profile measurements

Journal of Synchrotron Radiation

Volumn 12, Issue 5, 2005, Pages 670-674

  Hiraoka, N ^a,c   Buslaps, T ^a   Honkimaki V ^a   Suortti, P ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF HELSINKI   (Finland)

^c Institute of Physical and Chemical Research   (Japan)

Author keywords

Compton scattering; Dispersion compensation; X ray spectrometer

Indexed keywords

CRYSTALLOGRAPHY; LIGHT SCATTERING; MONOCHROMATORS; SCANNING; SYNCHROTRON RADIATION; X RAYS;

COMPTON SCATTERING; DISPERSION COMPENSATION; LAUE MONOCHROMATORS; WAVELENGTH GRADIENT;

X RAY SPECTROMETERS;

EID: 27644549480     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049505022569     Document Type: Conference Paper

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