Flank wear measurement by a threshold independent method with sub-pixel accuracy

International Journal of Machine Tools and Manufacture

Volumn 46, Issue 2, 2006, Pages 199-207

  Wang, W H ^a   Hong, G S ^a   Wong, Y S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Flank wear measurement; Image processing; Machine vision; Milling; Tool wear

Indexed keywords

COMMINUTION; COMPUTATIONAL METHODS; COMPUTER VISION; EDGE DETECTION; IMAGE PROCESSING; MACHINE TOOLS; WEAR OF MATERIALS;

FLANK WEAR MEASUREMENT; IMAGE CONTOUR DETECTION; THRESHOLDING-BASED METHODS; TOOL WEAR;

MEASUREMENT THEORY;

EID: 27644540211     PISSN: 08906955     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmachtools.2005.04.006     Document Type: Article

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