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Volumn 3, Issue 5, 2005, Pages 61-65
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Finding faults
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Author keywords
[No Author keywords available]
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Indexed keywords
EMBEDDED ELECTRONIC DEVICES;
GATE INSULATOR;
COMPUTER CRIME;
EMBEDDED SYSTEMS;
FLIP FLOP CIRCUITS;
ROM;
SECURITY OF DATA;
FAULT TOLERANT COMPUTER SYSTEMS;
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EID: 27644536988
PISSN: 15407993
EISSN: None
Source Type: Journal
DOI: 10.1109/MSP.2005.122 Document Type: Review |
Times cited : (14)
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References (3)
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