On the optical, structural, and morphological properties of ZrO2 and TiO2 dip-coated thin films supported on glass substrates

Materials Characterization

Volumn 55, Issue 4-5, 2005, Pages 263-271

  Cueto, Luisa F ^a   Sánchez, Enrique ^a   Torres Martínez, Leticia M ^a   Hirata, Gustavo A ^b  

^a UNIVERSIDAD AUTÓNOMA DE NUEVO LEÓN   (Mexico)

^b CENTRO DE CIENCIAS DE LA MATERIA CONDENSADA   (Mexico)

Author keywords

Dip coated thin films; Metal organic decomposition (MOD); Titanium oxide (TiO2); Zirconium oxide (ZrO2)

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; CRYSTALLIZATION; DECOMPOSITION; DIFFERENTIAL THERMAL ANALYSIS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; RAPID THERMAL ANNEALING; REFRACTIVE INDEX; STOICHIOMETRY; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; TITANIUM OXIDES; ULTRAVIOLET SPECTROSCOPY; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

DIP-COATED THIN FILMS; GRAZING-INCIDENCE X-RAY DIFFRACTION (GIXRD); METAL-ORGANIC DECOMPOSITION (MOD); ULTRAVIOLET VISIBLE SPECTROSCOPY (UV-VIS);

ZIRCONIA;

EID: 27644459967     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2005.05.004     Document Type: Article

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