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Volumn 87, Issue 19, 2005, Pages 1-3

Topological defects and the Staebler-Wronski effect in hydrogenated amorphous silicon

Author keywords

[No Author keywords available]

Indexed keywords

DANGLING BONDS; HYDROGENATED AMORPHOUS SILICON; STAEBLER-WRONSKI EFFECT; TOPOLOGICAL EFFECTS;

EID: 27644444105     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2130381     Document Type: Article
Times cited : (9)

References (21)
  • 13
    • 27644454369 scopus 로고    scopus 로고
    • MRS Symposia Proceedings No. 467, edited by E. A.Schiff, M.Hack, S.Wagner, R.Schropp, and I.Shimizu (Materials Research Society, Pittsburgh
    • M. Stutzmann, in Amorphous and Microcrystalline Silicon Technology-1997., MRS Symposia Proceedings No. 467, edited by, E. A. Schiff, M. Hack, S. Wagner, R. Schropp, and, I. Shimizu, (Materials Research Society, Pittsburgh, 1997), p. 747.
    • (1997) Amorphous and Microcrystalline Silicon Technology-1997 , pp. 747
    • Stutzmann, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.