Electrical discharge in a nanometer-sized air/water gap observed by atomic force microscopy

Journal of the American Chemical Society

Volumn 127, Issue 44, 2005, Pages 15562-15567

  Xie, Xian Ning ^a   Chung, Hong Jing ^a   Sow, Chorng Haur ^a   Adamiak, Kazimierz ^b   Wee, Andrew Thye Shen ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOUNDARY ELEMENT METHOD; FINITE ELEMENT METHOD; PROBABILITY; SUBSTRATES;

METHOD OF CHARACTERISTICS (MOC); NANOSCALE DISCHARGES;

ELECTRIC DISCHARGES;

NANOPARTICLE; WATER;

AMBIENT AIR; ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; HUMIDITY; IONIZATION;

EID: 27644439671     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja054225r     Document Type: Article

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