Experimental investigation of electron collection to solid and slotted tape probes in a high-speed flowing plasma

IEEE Transactions on Plasma Science

Volumn 33, Issue 4, 2005, Pages 1310-1323

  Choinière, Éric ^a,b   Bilén, Sven G ^c   Gilchrist, Brian E ^a   Fuhrhop, Keith R ^a   Gallimore, Alec D ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b DEFENCE RESEARCH AND DEVELOPMENT CANADA   (Canada)

^c The Pennsylvania State University   (United States)

Author keywords

Bare electrodynamic tethers; High voltage sheath; Langmuir probes; Orbital motion limited sheath; Plasma current collection; Plasma flow

Indexed keywords

ELECTRIC CURRENT COLLECTION; ELECTRIC CURRENT MEASUREMENT; ELECTRODYNAMICS; ELECTRON MOBILITY; PLASMA DENSITY; PLASMA FLOW; PLASMA SHEATHS; TEMPERATURE;

BARE ELECTRODYNAMIC TETHERS; ELECTRON CURRENT COLLECTION; HIGH-SPEED FLOWING PLASMA; HIGH-VOLTAGE SHEATH; LANGMUIR PROBES; ORBITAL-MOTION-LIMITED SHEATH; PLASMA CURRENT COLLECTION;

PLASMA PROBES;

EID: 27644435597     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2005.852366     Document Type: Article

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