MFM studies of microstructure and magnetic properties of iron thin films prepared by sputtering

Ultramicroscopy

Volumn 105, Issue 1-4, 2005, Pages 343-346

  Wang, Z H ^a   Chen, K ^a   Zhou, Y ^a   Zeng, H Z ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Domain structure; Iron thin films; Magnetic force microscopy; Morphology

Indexed keywords

ANNEALING; MAGNETIC DOMAINS; MAGNETIC PROPERTIES; MAGNETRON SPUTTERING; MICROSTRUCTURE; MORPHOLOGY; THIN FILMS;

DOMAIN STRUCTURE; IRON THIN FILMS; LATERAL RESOLUTION; MAGNETIC FORCE MICROSCOPY (MFM);

MICROSCOPIC EXAMINATION;

ARGON; GLASS; IRON;

CONFERENCE PAPER; CRYSTAL; FILM; MAGNETIC FIELD; MAGNETISM; MICROSCOPY; MICROWAVE OVEN; MOLECULAR MECHANICS; MORPHOLOGICAL ADAPTATION; OPTICAL RESOLUTION; STRUCTURE ANALYSIS; SURFACE PROPERTY; SYNTHESIS;

EID: 27544512963     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.06.047     Document Type: Conference Paper

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