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Volumn 1, Issue , 2005, Pages 621-624
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The AFM tweezers: Integration of a tweezers function with an AFM probe
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Author keywords
AFM; Microtweezers; Nanoprobe
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Indexed keywords
AFM;
AFM PROBE DEVICE;
MICROTWEEZERS;
NANOPROBE;
ANISOTROPY;
ATOMIC FORCE MICROSCOPY;
ETCHING;
MICROMACHINING;
NANOSTRUCTURED MATERIALS;
OXIDATION;
PROBES;
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EID: 27544510702
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2005.1496494 Document Type: Conference Paper |
Times cited : (12)
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References (4)
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